The Synopsys EDA Data Analytics solution claims to be the first of its kind in the semiconductor industry to provide AI-driven insight and optimisation to drive improvements across exploration, design, manufacturing, and testing processes.
The product combines the latest advances in AI to curate and operationalise magnitudes of heterogenous, multi-domain data to accelerate root-cause analysis and achieve greater design productivity, manufacturing efficiency, and test quality.
The AI-driven Synopsys EDA Data Analytics (.da) solution includes:
- Synopsys Design.da to perform deep analysis of data from Synopsys.ai design execution, providing chip designers with comprehensive visibility and actionable design insights to uncover power, performance, and area (PPA) opportunities.
- Synopsys Fab.da to store and analyze large streams of fab equipment process control data that increase operational efficiencies and maximize product quality and fab yield.
- Synopsys Silicon.da to collect petabytes of silicon monitor, diagnostic, and production test data from test equipment to improve chip production metrics, such as quality, yield, and throughput and silicon operation metrics, such as chip power and performance.
“Companies can now aggregate and leverage data across every layer of the EDA stack from architecture exploration, design, test, and manufacturing to drive improvements in PPA, yield, and engineering productivity,” says Synopsys vp Sanjay Bali.
EDA, testing, and IC fabrication tools generate vast amounts of heterogeneous design data such as timing paths, power profiles, die pass/fail reports, process control, or verification coverage metrics. Leveraging this data is critical for improving productivity, PPA, and parametric/manufacturing yield.
Extending the Synopsys.ai full-stack EDA suite with a big data analytics solution provides multi-domain data aggregation and curation through AI-driven flows and methodologies that deliver significant productivity gains with improved QoR.
With deeper design insights, chip designers can achieve more effective debug and optimization workflows.
In addition, IC suppliers can rapidly localise and correct problem areas throughout mask, fabrication, and test processes before they impact product quality and yield.
Companies also benefit from generative AI methods on their data sets to enable new use cases like knowledge assistants, preemptive and prescriptive what-if exploration, and guided issue resolution.
The Data Analytics Solution, including Design.da, Fab.da and Silicon.da, are available now.
More at: https://www.synopsys.com/ai/ai-powered-eda.html#da
